• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    In order to enable an improved functional test of a control unit (6) of the switching device (5) of an electrical switchgear (4), a test device (10) is provided which has a signal input (9) with a positive pin (p) and a negative pin (n ) and is designed so that an input signal (Ue) between the positive pin (p) and the negative pin (s) can be applied. The tester (10) also has a separating unit (12), which is connected to the positive pin (p) and the negative pin (s) and is configured to receive a positive signal component in the form of a positive track (Ue +) from the input signal (Ue) ) and output at a first pin (A) and to separate from the input signal a negative signal component in the form of a negative track (Ue-) and output at a second pin (B). The use of the test device for testing a control unit (6) of the switching device (5) is described, wherein the test device (10) simulates the switching device (5), the signal input (9) of the test device is connected to the control unit (6) and the control unit (6) an input signal (Ue) is output to the signal input (9).
    公开号:AT518178A4
    申请号:T50093/2016
    申请日:2016-02-15
    公开日:2017-08-15
    发明作者:
    申请人:Omicron Electronics Gmbh；
    IPC主号:
    专利说明:

    Test device for testing a control unit of a switching device of a switchgear
    The subject invention relates to a test apparatus and a method for testing a control unit of a switching device of a switchgear wherein the tester has a signal input. Likewise, the invention relates to the use of the test device for testing a control unit of a switching device of a switchgear.
    Often devices for testing control units of electrical switching devices are necessary. Especially in the field of electrical protection and electrical power supply, the testing of the function of switching devices and their control units is important and often even prescribed. For example, in electrical medium voltage networks mounted on masts switching devices are often equipped with electro-magnetic actuators and connected via control connections with control units. Typically, a tester is used to simulate the switching device. For this purpose, the switching device and the control connection is disconnected from the control unit and instead a tester is connected via an adapter cable to the control unit to check its function. The tester must then generate appropriate electrical signals to stimulate the control unit to certain reactions. The reactions are recorded and evaluated by the test instrument.
    Among other things, control units have the function of temporarily outputting a positive voltage to the coil of the actuator via control connections and thus to open the switching device. To close the switching device, a negative voltage is output via the same or a different control lines. Typically, DC voltages in the range of 12-250V are used. The duration of the voltage pulses is typically in the range of 10 ms to 100 ms and is dependent on the configuration of the switching device. To enable switching of the switching device, the switching device, i. In the first place, the connected coil of the magnetic actuator, often first detected by the control unit, for example, to detect a defective control connection, or to ensure that the switching device is connected. This detection takes place via briefly output pulses by the control unit, the pulses must of course be so short that the switching device does not trigger a switching operation. By measuring the return current, it is concluded that the connected load (that is, primarily the resistance of the coil). To determine the state of the actuator, i. Whether the switching device is actuated or not operated, it is also common in some control units to measure the impedance of the magnetic actuator continuously or at intervals, since the impedance of the switching device depends on the state of the actuator.
    There are usually adapter cables necessary to connect these control lines of the control unit to the measuring input of a tester. These adapter cables often include additional electronics or additional electrical circuitry. In most cases, resistors are used in the adapter cable in order to simulate the impedance of the coil of the magnetic actuator and thus to suggest to the control unit a connected switching device. In addition, in the adapter cables devices are necessary, which separate the voltage applied to the control lines positive and negative voltages and convert to each positive voltages and forward separately (ie via separate lines) to the tester. These resulting positive voltages can thus be applied to the tester to two different binary signal inputs with two pins, after which the tester can check the function of the control unit.
    The hitherto known solution thus requires additional components to enable a test of the control unit. The manufacture of adapter cables incorporating these components thus becomes more complex, more expensive, and prone to error. Furthermore, different adapter cables having different electrical characteristics must be used when testing switching devices having different electrical characteristics. In addition, several binary signal inputs of the tester must be occupied, which makes the actual wiring more complex and error-prone.
    The object of the subject invention is therefore to enable, starting from the above-described prior art, an improved functional test of the switching device by a tester.
    This object is achieved by the signal input of the tester has a positive pin and a negative pin and is designed so that an input signal between the positive pin and the negative pin can be applied. Furthermore, the tester has a separation unit which is connected to the positive pin and the negative pin and is designed to separate from the input signal a positive signal component in the form of a positive track and output at a first pin and the input signal a negative signal component in the form of a to separate negative track and out-added to a second pin.
    Thus, the tester provides a ternary signal input. In contrast to the conventional binary input, the input voltage in the tester is divided into a positive and negative track by means of the separation unit. In contrast to the prior art, the solution according to the invention requires no external components in order to divide the signal into two tracks and thus occupies only half the number of inputs on the test apparatus. The invention allows the tester to test the control by means of a
    Adapter cable to connect directly to the control line, the adapter cable must have no electronics. The production of adapter cables is cheaper and easier. In addition, the risk of component errors in the adapter cable is minimized.
    The tester can thus be used to test a control unit of a switching device of a switchgear by the tester emulates the switching device. The signal input of the tester is connected to the control unit and the control unit outputs an input signal to the signal input.
    Advantageously, the tester has a logic unit connected to the first pin and the second pin and independently processing the positive track and the negative track.
    Further, the tester may include a comparison unit that compares the positive track with a positive threshold and the negative track with a negative threshold.
    Likewise, the tester may have the tester a detection unit which detects the positive and / or negative edges of the positive track and / or the negative track.
    The isolation unit can be advantageously implemented by a rectifier, the first pin being connected to a first input of the rectifier and the positive pin, and the second pin being connected to the second input of the rectifier and the negative pin.
    This implementation is particularly cost effective since only a full-wave rectifier, i. usually 4 diodes are needed. It is possible to idle the rectifier or to draw an input current which is represented by a fixed value or is dynamically adjustable as the application requires.
    Further, there may be a first analog-to-digital converter connected to the first pin and digitizing the positive track and / or a second analog-to-digital converter connected to the second pin and digitizing the negative track.
    Thus, a further treatment of the positive or negative track in digital form is possible, whereby positive or negative thresholds, positive or negative edges, etc. in a simple way, for example in the logic unit, analyzed and can be set from actions.
    The signal input can have digital input filters F, which cause, for example, interference suppression or debouncing of input signals. Thus, the filter can filter out short glitches or debounce filters debounce the input signal. The parameters, e.g. Cut-off frequencies, as well as filter run times such as debounce times or interference suppression times of the filters can be set individually by the advantageous digital realization depending on the requirements of different switching devices.
    The subject invention will be explained in more detail below with reference to Figures 1 to 3, which show by way of example, schematically and not by way of limitation advantageous embodiments of the invention. It shows
    1 shows a part of an electrical supply network,
    2 shows the supply network with separate connection between switching device and
    Control unit connected to a tester for testing, and
    3 shows a circuit construction of the tester according to the invention.
    In Fig. 1, a part of an electrical supply network 1 is shown, in the illustrated embodiment, a 3-phase overhead line, the lines 3 are stretched between masts 2 in a conventional manner. On the mast 2, a switchgear 4 is provided as a safety device, which consists of a switching device 5 and an associated control unit 6. The switching device 5 is, for example, in a known manner, a recloser or a circuit breaker in the form of a magnetic actuator, which includes a coil. The switching device 5 is able to disconnect or connect at least one of the lines 3 by a switching action triggered by the control unit 6. Of course, the invention is not limited to the application in an electrical supply network 1 in the form of an overhead line, but can be used in any system for transmission or distribution of electrical energy with safety devices in the form of a switchgear 4 with a switching device 5 and an associated control unit 6 ,
    The switching device 5 is for this purpose connected to a control connection 7 with the control unit 6. For this purpose, the control connection 7 generally comprises a number of control lines for the transmission of control input variables and control output variables. Control outputs typically trigger switching operations. Here, on the side of the control unit 6, for each phase individually, often separate signal outputs for a trip signal (ie opening the switching device 5) and for a close signal (ie closing the switching device 5), but it can also only one binary signal input can be used for trip and close. In particular, relevant to the invention are control output variables. These control outputs are signals supplied by the control unit 6, e.g. in response to the control inputs, are generated and with which the function of the switching device 5 is controlled, for example, a switching action is triggered. In this case, for example, output by the control unit 6 as a control output variable via the control lines 7, a positive pulse for the trip signal, or a negative pulse as a close signal.
    To test the switchgear 4, the control connection 7 between the switching device 5 and the control unit 6 is disconnected, as shown in Fig.2. It would also be possible that the switching device 5 is not connected to the control unit 6 before the test, for example, during initial startup. Then the separation of the control connection 7 would be omitted. This is quite often the case as the control units 6 are often parameterized prior to installation and then tested with the tester 10 before they are "fielded" and installed. The control unit 6 is connected for testing with an adapter cable 11 with a test device 10, which simulates the switching device 5 in order to check the proper function and parameterization of the control unit 6 of the switchgear 4 can. The adapter cable 11 is connected with one side to the signal output of the control unit 6 and with the other side to the signal input 9 of the test apparatus 10. Of course, signal inputs of the control unit 6 and signal outputs of the test apparatus 10 can also be contacted with the adapter cable 11. The testing device 10 thus serves to simulate or simulate the switching device 5. The testing device 10 receives control output variables of the control unit 6 via the signal input, with testing devices 10 according to the prior art generally having binary signal inputs. The test apparatus 10 for simulating the switching device 5 must therefore be configured in order to be able to simulate the signal inputs and signal outputs present in the switching device 5. Whereby not necessarily all signal inputs or signal outputs are required for a test. Usually, a signal input 9 for the trip signal and one signal input 9 for the close signal are present on the test apparatus 10, with each signal input 9 again consisting of two pins. For this purpose, the positive control signal (for example Trip) or negative control signal (for example Close) is split in a electronics or electrical circuit accommodated in the adapter cable 11 and supplied to a respective binary signal input 9. This can be done either as a positive or as a negative control signal per signal input is in any case only one (positive or negative) switching threshold possible. For this purpose, the adapter cables 11 are usually provided with electronics or electrical wiring, which makes the production of the adapter cable 11 more costly and also adversely affects their robustness.
    In addition, the switching device 5 to an impedance, which must also be considered in the electronics or the electrical wiring of the adapter cable 11, for example in the form of resistors. Thus, different adapter cables 11 are necessary for different switching devices 5 with different impedances. This impedance is, for example, in the implementation of the switching device 5 by a magnetically actuated actuator also dependent on the switch position of the switching device 5. This means that when simulating the switching device 5 by the tester 10 and the adapter cable 11 during operation, as soon as a switching operation by the control unit 6 is triggered, even the variable impedance through the tester 10 and the adapter cable 11 must be considered.
    According to the invention, the signal input 9 of the tester 10 now has a positive pin p and a negative pin n and is designed so that an input signal Ue between the positive pin p and the negative pin n can be applied, as shown in Figure 3. Next, the tester 10, a separation unit 12 which is connected to the positive pin p and the negative pin n and is configured to separate from the input signal Ue a positive signal component in the form of a positive track Ue + and output to a first pin A, or to provide internally, and to separate from the input signal, a negative signal component in the form of a negative track Ue and ausge on a second pin B, or provide internally available.
    The testing device 10 according to the invention thus makes it possible to use only one signal input 9 for both a trip signal and a close signal. Since the signal input 9 is designed ternary, only a smaller number of inputs, as in a binary embodiment of the signal inputs 9 is necessary.
    A testing device 10 according to the invention can simulate the switching device 5 for testing a control unit 6 of a switching device 5 of a switchgear 4, the signal input 9 of the test device 10 being connected to the control unit 6, e.g. via an adapter cable 11, and from the control unit 6, an input signal Ue is output to the signal input 9.
    Furthermore, the test apparatus 10 may have a logic unit 13 which is connected to the first pin A and the second pin B and processes the positive track Ue + and the negative track Ue- independently of each other.
    In addition, the test apparatus 10 may include a comparison unit 14, for example in the logic unit 13, which compares the positive track Ue + with a predetermined or set positive threshold Us + and the negative track Ue with a predetermined or set negative threshold US-.
    The test apparatus 10 may also have a detection unit 15, for example in the logic unit 13, which detects the positive and / or negative edges of the positive track Ue + and / or the negative track Ue-.
    Especially advantageous is the implementation of the separation unit 12 by a rectifier, wherein the first pin A is connected to a first input terminal of the rectifier and the positive pin p and the second pin B is connected to the second input terminal of the rectifier and the negative pin. In other words, the first input terminal of the rectifier, the positive pin p and the first pin A and the second input terminal of the rectifier, the negative pin and the second pin B coincide. The realization of the separation unit 12 in the form of a rectifier means a low circuit complexity.
    In addition, a first analog / digital converter ADC1 may be present, which is connected to the first pin A and the positive track Ue + digitized and / or a second analog / digital converter ADC2 be present, which is connected to the second pin B and the negative track Ue digitized. This allows the digital processing of the positive track Ue + and the negative track Ue- and the simple configuration of the comparison unit 14 and the detection unit 15 as software.
    In Fig. 3 shows a possible embodiment of the invention is shown. At the signal input 9, an input voltage Ue, which is supplied by the control unit 6 via the adapter cable 11, is applied to the positive pin p and to the negative pin n. A separation unit 12 is connected by way of example in the form of a rectifier to the positive pin p and the negative pin n. The positive pin p and the negative pin n are connected to the input side of the rectifier.
    The rectifier is designed in the embodiment shown as a well-known bridge rectifier with diodes, with other embodiments of the rectifier are conceivable.
    By tapping the positive portion of the input voltage Ue at the first pin A of the rectifier, a positive track Ue + the input voltage Ue can be separated. By tapping the negative portion of the input voltage Ue at the second pin B of the rectifier, a negative track Ue the input voltage Ue can be separated. In order to convert the positive track Ue + and the negative track Ue- to voltages that can be processed by the first analog-to-digital converter ADC1 and the second analog-to-digital converter ADC2, the positive track Ue + and the negative track Ue. each converted by means of a voltage divider in the form of resistors R2 and R4, respectively R5 and R3 to a lower voltage value. The digitized values of the positive track Ue + and the negative track Ue- are supplied to a logic unit 13, which in this case includes a comparison unit 14, and processed independently of each other. The comparison unit 14 compares the positive track Ue + or the negative track Ue with a predetermined positive threshold Us + or a predetermined negative threshold Us-. From this, a trip or close signal sent by the control unit 6 can be deduced.
    In the logic unit 13 digital filters can be realized. A major advantage of the digital filter realization are the different filter parameters that can be set during operation depending on the requirements. Of course, it is also possible to place analog filters in front of the ADCs, but with the disadvantage of the fixed parameters and the additional circuit complexity.
    The realization of the separation unit 12 in the form of a rectifier at the input has circuit advantages, since the use of a unipolar power supply or ADC conversion is possible and a controlled current source by means of a MOSFET in a simple manner can be realized.
    Of course, it would also be possible to perform the signal input 9 bipolar and then to generate the positive track Ue + and the negative track Ue in a digital manner from the input voltage Ue. However, this solution brings with respect to the previously described embodiment some disadvantages: The realization of the ADCs, in particular their power supply is more complex and a voltage-controlled current source using only one MOSFET is not possible. Instead, a bipolar voltage-controlled current source would be needed, which would be significantly more complex in terms of circuitry. For example, one possible implementation would include an n-channel MOSFET and a p-channel MOSFET, respectively. This solution can thus be realized only in a complex and complex cable solution, since twice as many (binary) inputs and, as mentioned, additionally adjustable impedances are necessary.
    The rectifier shown in Fig. 3 could also be operated with high-impedance output terminals A1, A2 of the rectifier, so almost idle. However, a closed circuit must be present in any case, so that the rectifier can actually be operated and thus the positive and negative tracks can be separated.
    However, in order to simulate the impedance of the switching device 5 by the test device 10 in the form of a dynamically adjustable input impedance Z of PrüfgerätslO, in the tester 10, a controlled current sink 20 may be present, which is connected to the signal input 9, wherein the controlled current sink 20 from the signal input an input current iq branches off.
    Most advantageously, the controlled current sink 20 is realized by means of a controlled control circuit, in which a controlled voltage source Uq and a train reference potential, e.g. Earth, shunt R1 are present. The height of the input current Iq of the controlled current sink 20 is set by a current h flowing across the shunt R1, the current h being set by the controlled voltage source Uq and approximately corresponding to the input current iq.
    In Fig. 3, the signal input 9 via the separation unit 12, in this case the rectifier, and the resistor R8, connected to the controlled current sink 20, for example in the form of an n-channel MOSFET. The MOSFET as a controlled current sink 20 receives via the drain input from a first output of the rectifier, the input current iq, which is set by the controlled voltage source Uq, the second output of the rectifier is at reference potential (here ground). For this purpose, the controlled voltage source Uq is connected to the non-inverting input of an OPV. The inverting input of the OVP is connected via the resistor R7 to the first terminal of the shunt R1, which sets the voltage of the controlled voltage source Uq at the shunt R1, since the second terminal of the shunt Ri, as well as the negative output of the voltage source Uq to the reference potential (here mass) is connected. As a result, current i flows via shunt R-i, which corresponds approximately to the input current iq obtained via the controlled current sink 20. The first terminal of the shunt R1 is connected to the source input S of the MOSFET. Between the non-inverting input of the OPV and the output of the OPV, a capacitor C1 is connected. Furthermore, the output of the OPV is connected through resistor R6 to the gate of the MOSFET. Since the MOSFET is preferably operated in the saturation region, the input current iq, which corresponds to the drain current of the MOSFET, via the drain-source voltage, i. in further line via the controlled voltage source Uq, set.
    Of course, the controlled current sink 20 can alternatively be realized for example by means of bipolar transistors. However, such a change in the control would mean a reduced dielectric strength
    The input protection resistor R8 has a positive temperature coefficient. If the input currents are too high, the input protection resistor R8 serves as a reversible thermal fuse, i. the value of the input resistor R8 increases with increased input current iq, whereby the current sink 20 is protected against overcurrents. The operational amplifier OPV serves as a P-controller, wherein the input voltage Uq at the shunt R1, which is applied to the non-inverting input, is compensated. The proportional resistance R7 gives in relation to R1 the proportional proportion of the realized by the OPV circuit P-controller. The thereby adjusting current at the output of the operational amplifier OPV results from the quotient of input voltage Uqam non-inverting input of the OPV and the resistance of the shunt R1. The capacitor C1 serves to stabilize the regulator by reducing the gain at higher frequencies. The gate resistor R6 is used to drive the MOSFET.
    An inventive test device 10 can thus be used to adjust the input impedance Z by the adjustable input current iq and the applied input voltage Ue.
    For this purpose, the controlled current sink 20 or the controlled current sink 20 controlled controlled voltage source Uq can be controlled by software. In this way, the input current iq diverted from the signal input 9 can be set, which in combination with the input voltage Ue yields the desired input impedance Z. The dynamically adjustable input impedance Z on the one hand enables a simulation of various switching devices 5 with a test device 10 without the need for different adapter cables 11 (apart from possibly different plug-in connections). Furthermore, an impedance of the switching device 5 which is dependent on the switching state can be taken into account, since during operation / test of the test device 10, the input impedance Z can be varied as desired.
    权利要求:
    Claims (8)
    [1]
    1. testing device for testing a control unit (6) of a switching device (5) of an electrical switchgear (4), wherein the test device (10) has a signal input (9), characterized in that the signal input (9) has a positive pin (p) and a negative pin (n) and is designed such that an input signal (Ue) between the positive pin (p) and the negative pin (s) can be applied, that the tester (10) has a separation unit (12) is connected to the positive pin (p) and the negative pin (n) and configured to separate from the input signal (Ue) a positive signal component in the form of a positive track (Ue +) and output to a first pin (A) and the input signal to separate a negative signal component in the form of a negative track (Ue-) and output at a second pin (B).
    [2]
    2. Testing device according Anspruchl, characterized in that the testing device has a logic unit (13) which is connected to the first pin (A) and the second pin (B) and the positive track (Ue +) and the negative track (Ue-) processed independently of each other.
    [3]
    3. Test device according to claim 1 or 2, characterized in that, the test device has a comparison unit (14), the positive track (Ue +) with a positive threshold (Us +) and the negative track (Ue-) with a negative threshold (Us ) compares.
    [4]
    4. Test device according to one of claims 1 to 3, characterized in that the test device has a detection unit (15) which detects the positive and / or negative edges of the positive track (Ue +) and / or the negative track (Ue-).
    [5]
    5. Testing device according to one of claims 1 to 4, characterized in that the separation unit (12) is realized by a rectifier, wherein the first pin (A) is connected to a first input of the rectifier and the positive pin (p) and the second pin (B) is connected to the second input of the rectifier and the negative pin.
    [6]
    6. Testing device according to one of claims 1 to 5, characterized in that a first analog / digital converter (ADC1) is present, which is connected to the first pin (A) and the positive track (Ue +) digitized and / or a second analog / digital converter (ADC2) connected to the second pin (B) and the negative track (Ue digitized.
    [7]
    7. Testing device according to one of claims 1 to 6, characterized in that an input filter is present, which is realized digitally.
    [8]
    8. Use of a test device according to one of claims 1 to 7, characterized in that for testing a control unit (6) of a switching device (5) of a switchgear (4) the test device (10) emulates the switching device (5), the signal input (9 ) of the tester is connected to the control unit (6) and the control unit (6) outputs an input signal (Ue) to the signal input (9).
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    法律状态:
    2018-09-15| HA| Change or addition of new inventor|Inventor name: RAINER KUENG, AT Effective date: 20180801 Inventor name: MICHAEL JOCHUM, AT Effective date: 20180801 Inventor name: STEPHAN GEIGER, AT Effective date: 20180801 |
    优先权:
    申请号 | 申请日 | 专利标题
    ATA50093/2016A|AT518178B1|2016-02-15|2016-02-15|Test device for testing a control unit of a switching device of a switchgear|ATA50093/2016A| AT518178B1|2016-02-15|2016-02-15|Test device for testing a control unit of a switching device of a switchgear|
    US16/077,952| US11163005B2|2016-02-15|2017-02-10|Test device for testing a control unit of a switching apparatus of a switchgear|
    CA3014682A| CA3014682C|2016-02-15|2017-02-10|Test device for testing a control unit of a switching apparatus of a switchgear|
    PL17704258T| PL3417301T3|2016-02-15|2017-02-10|Test device for testing a control unit of a switching apparatus of a switchgear|
    AU2017219678A| AU2017219678B2|2016-02-15|2017-02-10|Test device for testing a control unit of a switching apparatus of a switchgear|
    PCT/EP2017/052961| WO2017140582A1|2016-02-15|2017-02-10|Test device for testing a control unit of a switching apparatus of a switchgear|
    ES17704258T| ES2796474T3|2016-02-15|2017-02-10|Test apparatus for testing a control unit of a switchgear switchgear|
    EP17704258.7A| EP3417301B1|2016-02-15|2017-02-10|Test device for testing a control unit of a switching apparatus of a switchgear|
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